Short-range order and atomic diffusion in liquid Ge and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:msub><mml:mi>Si</mml:mi><mml:mn>20</mml:mn></mml:msub><mml:msub><mml:mi>Ge</mml:mi><mml:mn>80</mml:mn></mml:msub></mml:mrow></mml:math> investigated by neutron scattering and x-ray diffraction
نویسندگان
چکیده
We studied structure and dynamics in liquid Ge ${\text{Si}}_{20}{\text{Ge}}_{80}$. Quasielastic neutron scattering (QNS) was employed to accurately determine the self-diffusion coefficient. Static factors were measured using x-ray diffraction. Containerless processing via electromagnetic levitation (EML) enabled obtain over a broad temperature range from metastable regime of undercooled melt several hundred Kelvin above melting point. Moreover, isotopic substitution combination with diffraction allowed partial ${S}_{\mathrm{NN}}(q), {S}_{\mathrm{NC}}(q), {S}_{\mathrm{GeGe}}(q)$, ${S}_{\mathrm{GeSi}}(q)$ for The topological structures ${\text{Si}}_{20}{\text{Ge}}_{80}$ are very similar. In addition, coefficients equal within error limits.
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ژورنال
عنوان ژورنال: Physical review
سال: 2021
ISSN: ['0556-2813', '1538-4497', '1089-490X']
DOI: https://doi.org/10.1103/physrevb.104.134108